In the course of miniaturization of electronic and microfluidic devices, reliable predictions of the stability of ultrathin films have a strategic role for design purposes. Consequently, efficient computational techniques that allow for a direct comparison with experiment become increasingly important. Here we demonstrate, for the first time, that the full complex spatial and temporal evolution of the rupture of ultrathin films can be modelled in quantitative agreement with experiment. We accomplish this by combining highly controlled experiments on different film-rupture patterns with computer simulations using novel numerical schemes for thin-film equations. For the quantitative comparison of the pattern evolution in both experiment and simulation we introduce a novel pattern analysis method based on Minkowski measures. Our results are fundamental for the development of efficient tools capable of describing essential aspects of thin-film flow in technical systems.
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We thank Stephan Herminghaus for many stimulating discussions and Renate Konrad for help in calculating the Minkowski measures. This work was supported by the Priority Program Wetting and Structure Formation at Interfaces of the German Science Foundation through individual research grants to the participating groups. This program provided an ideal forum for the interaction of mathematicians, theoretical and experimental physicists which lead to this interdisciplinary work.
The authors declare no competing financial interests.
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Becker, J., Grün, G., Seemann, R. et al. Complex dewetting scenarios captured by thin-film models. Nature Mater 2, 59–63 (2003). https://doi.org/10.1038/nmat788
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